Evaluation of Free Carrier Lifetime and Deep Levels of the Thick 4H-SiC Epilayers

Autor:	Syunsuke Izumi, Isaho Kamata, Kunikaza Izumi, Hidekazu Tsuchida, Takeshi Tawara
Rok vydání:	2004
Předmět:	Materials science Mechanics of Materials business.industry Mechanical Engineering Optoelectronics General Materials Science Condensed Matter Physics business Free carrier
Zdroj:	Materials Science Forum. :565-568
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.457-460.565
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0bca18470f7393e56b20b14de1d852b9 https://doi.org/10.4028/www.scientific.net/msf.457-460.565 Zobrazit plný text záznamu