Sulphur adsorption on the fivefold surface of the i-Al–Pd–Mn quasicrystal
| Autor: | Ronan McGrath, D. W. Delaney, Renee D. Diehl, Vinod R. Dhanak, Julian Ledieu, T.A. Lograsso |
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| Rok vydání: | 2002 |
| Předmět: |
Auger electron spectroscopy
Low-energy electron diffraction Extended X-ray absorption fine structure Chemistry Quasicrystal Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films law.invention Bond length Crystallography Adsorption law Materials Chemistry Scanning tunneling microscope Absorption (chemistry) |
| Zdroj: | Surface Science. 512:77-83 |
| ISSN: | 0039-6028 |
| DOI: | 10.1016/s0039-6028(02)01575-3 |
| Popis: | The adsorption of sulphur on the fivefold flat-terraced surface of the icosahedral Al–Pd–Mn quasicrystal ( i -Al–Pd–Mn) has been studied using extended X-ray absorption fine structure (EXAFS), Auger electron spectroscopy and low energy electron diffraction (LEED). Surface EXAFS data collected by Auger electron yield from the S saturated surface give average bond lengths for S–Al and S–Pd of 2.10±0.06 and 2.40±0.06 A respectively. The data indicate that single-site adsorption on the unreconstructed surface may be ruled out; this is consistent with near-edge EXAFS data and the disappearance of the LEED pattern upon adsorption of sub-monolayer amounts of S. The implication of this finding is that adsorbate-induced reconstruction and/or multiple-site adsorption occurs in this system. |
| Databáze: | OpenAIRE |
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