Reaction study of cobalt and silicon nitride

Autor: Herbert L. Ho, Tue Nguyen, David E. Kotecki, Tai D. Nguyen
Rok vydání: 1993
Předmět:
Zdroj: Journal of Materials Research. 8:2354-2361
ISSN: 2044-5326
0884-2914
DOI: 10.1557/jmr.1993.2354
Popis: The interaction of cobalt (Co) and low-pressure chemical-vapor-deposited silicon nitride (LPCVD Si3N4) during anneals from 200 °C−1000 °C in vacuum, Ar, and Ar–H2 ambient (95% Ar and 5% H2) has been studied. After the anneals, reduction of Si3N4 by Co to form cobalt silicide and cobalt nitride phases has been observed. Reduction of Si3N4 initially occurs at 600 °C; however, gross physical damage occurs at temperatures of ∼900 °C in Ar. The addition of hydrogen to the ambient enhances the onset of physical damage to the nitride film by as much as 200 °C. Mechanisms governing the Co/Si3N4 reaction have been proposed.
Databáze: OpenAIRE