Advancing test compression to the physical dimension
| Autor: | Brian Edward Foutz, Vivek Chickermane, Louis Christopher Milano, Christos Papameletis, Dale Meehl, Paul Alexander Cunningham, David George Scott, Krishna Chakravadhanula, Steev Wilcox |
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| Rok vydání: | 2017 |
| Předmět: |
Computer science
0211 other engineering and technologies Code coverage Test compression Data_CODINGANDINFORMATIONTHEORY 02 engineering and technology 020202 computer hardware & architecture Compression ratio 0202 electrical engineering electronic engineering information engineering Overhead (computing) Voltage droop Routing (electronic design automation) Simulation 021106 design practice & management Test data Volume (compression) |
| Zdroj: | ITC |
| Popis: | Test Compression ratios are currently stalled at 100–200X. A new 2-dimensional physically-aware sequential Compressor-Decompressor design addresses the severe wiring congestion as well as the test coverage droop and pattern spike at the highest compression ratios. Results on some commonly used industrial designs shows a 2X reduction in routing overhead and congestion associated with Test Compression logic. The target test coverage is maintained while achieving up to 3.7X reduction in test data volume and test application time beyond the conventional methods. |
| Databáze: | OpenAIRE |
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