Determination of trace impurities in tantalum powder and its compounds by inductively coupled plasma optical emission spectrometry using solvent extraction

Autor:	G. Anil, T. L. Prakash, M.R.P. Reddy
Rok vydání:	2006
Předmět:	Matrix (chemical analysis) chemistry.chemical_compound Hydrofluoric acid chemistry Trace Amounts Impurity Tantalum pentoxide Tantalum Analytical chemistry chemistry.chemical_element Inductively coupled plasma Microwave digestion Analytical Chemistry
Zdroj:	Journal of Analytical Chemistry. 61:641-643
ISSN:	1608-3199 1061-9348
Popis:	A procedure was developed for the analysis of 18 trace impurity elements in capacitor-grade tantalum powder (Ta), potassium tantalum fluoride (K2TaF7), and tantalum pentoxide (Ta2O5) using inductively coupled plasma optical emission spectrometry (ICP-OES). The detection limits achieved were in the ppb levels. The samples were dissolved in hydrofluoric acid (HF) in a microwave digestion system and the Ta matrix was extracted using cyclo hexanone. The impurity traces remained almost completely in the aqueous phase.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0b78dbbc55bb4060cfb45eb8bdc503b0 https://doi.org/10.1134/s1061934806070069 Zobrazit plný text záznamu Plný text ve formátu PDF