Layer-by-layer quasi-epitaxial growth of a crystalline organic thin film

Autor:	Stephen R. Forrest, P. Eisenberger, Paul Fenter, P.E. Burrows
Rok vydání:	1995
Předmět:	Diffraction High energy Chemistry business.industry Layer by layer Analytical chemistry Condensed Matter Physics Epitaxy Inorganic Chemistry Molecular level Optics Electron diffraction Lattice (order) Materials Chemistry Thin film business
Zdroj:	Journal of Crystal Growth. 152:65-72
ISSN:	0022-0248
DOI:	10.1016/0022-0248(95)00064-x
Popis:	We use reflection high energy electron diffraction and grazing incidence X-ray diffraction to study films of the archetype crystalline organic material: 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) grown on Au(111) by organic molecular beam deposition. Although the PTCDA lattice is significantly mismatched to the Au(111) substrate, the films are orientationally aligned and have a well defined film thickness, providing evidence for layer-by-layer “quasi-epitaxial” growth. Furthermore, we have performed the first characterization of the molecular level disorder in these films, and have determined the presence of a significant (3.8%) strain in the 2D lattice parameters.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0b66720f1dc40ed9e8411b51ee07e268 https://doi.org/10.1016/0022-0248(95)00064-x Zobrazit plný text záznamu Full Text from ScienceDirect