Recristallisation de TiO2, GeO2, Si1−GeO2 en solutions hydrothermales fluorées

Autor: Y Toudic, M. Passaret, R Aumont, A Regreny, J.F Bayon
Rok vydání: 1972
Předmět:
Zdroj: Journal of Crystal Growth. :524-529
ISSN: 0022-0248
DOI: 10.1016/0022-0248(72)90292-8
Popis: The crystallisation of titanium, germanium, and silicon oxides in KF, CsF, and RbF solutions was studied at 300–600°C and 500–1500atm. Crystallisation of mixed Si1−xGexO2 crystals, with Ge atomic concentration up to 5%, is described. The spontaneous crystallisation of rutile, quartz and mixed Si1−xGexO2 crystals and their growth on seed crystals was studied. The optimum concentration of solvent for growth of a particular oxide in the range 0.5–5 M alkali fluoride differs with the alkali. When the temperature is higher, germanates or fluorides are obtained.
Databáze: OpenAIRE