Popis: |
The crystallisation of titanium, germanium, and silicon oxides in KF, CsF, and RbF solutions was studied at 300–600°C and 500–1500atm. Crystallisation of mixed Si1−xGexO2 crystals, with Ge atomic concentration up to 5%, is described. The spontaneous crystallisation of rutile, quartz and mixed Si1−xGexO2 crystals and their growth on seed crystals was studied. The optimum concentration of solvent for growth of a particular oxide in the range 0.5–5 M alkali fluoride differs with the alkali. When the temperature is higher, germanates or fluorides are obtained. |