Behavior of Hydrogen Atoms in Perovskite-Type Oxide Thin Films under Electric Fields

Autor:	Isao Sakaguchi, T. Suzuki, Youichi Mizuno, Kentaro Morito, Naoki Ohashi, Hajime Haneda, Kenji Matsumoto
Rok vydání:	2009
Předmět:	Materials science Hydrogen Mechanical Engineering Oxide Analytical chemistry chemistry.chemical_element Cathode law.invention Anode Capacitor chemistry.chemical_compound chemistry Mechanics of Materials law Electric field General Materials Science Thin film Perovskite (structure)
Zdroj:	Key Engineering Materials. :281-284
ISSN:	1662-9795
DOI:	10.4028/www.scientific.net/kem.421-422.281
Popis:	The behavior of hydrogen in (Ba,Sr)TiO3 (BST) thin film capacitors under electric fields was investigated by performing secondary ion mass spectroscopy (SIMS) analyses. It was clearly observed that the ingress of atmospheric hydrogen into BST thin film capacitors occurred through the anode and that it diffused toward the cathode under electric fields. In addition, it was found that the deterioration of the I-V properties of the BST thin film capacitors can be interpreted in terms of the distribution of hydrogen concentration in the BST thin films.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0aac0e1d8d911003dec53a4acb1c1775 https://doi.org/10.4028/www.scientific.net/kem.421-422.281 Zobrazit plný text záznamu