Random polarization distribution of multi-domain model for polycrystalline ferroelectric HfZrO2

Autor: C.-Y. Liao, Shu-Tong Chang, Shih-Hung Chiang, Hong Liang, Jen-Hao Liu, Kuan-Ting Chen, Fu-Jhu Hsieh, Min-Hung Lee, Kai-Shin Li, K.-Y. Hsiang, Shao-Hua Chang
Rok vydání: 2020
Předmět:
Zdroj: Semiconductor Science and Technology. 35:125011
ISSN: 1361-6641
0268-1242
DOI: 10.1088/1361-6641/abba41
Popis: Device dimension scaling down to be comparable to the domain size of polycrystalline ferroelectric HfZrO2 (HZO) is evaluated for subthreshold swing (SS) and drain-induced barrier lowering (DIBL) by numerical simulation. The proposed multi-domain modeling involves polarization random location in HZO and probability with Gaussian distribution, as well as being integrated with the Landau–Khalatnikov equation. A small device with a few domains exhibits steep SS compared with large dimension with many domains. The N-DIBL (negative-DIBL) is also estimated by using this model, and the negative capacitance effect retards the short-channel effects significantly. The trend of the experimental data and simulation results of fin field-effect transistors and planar field-effect transistors is consistent with nano-scale and micro-scale devices, respectively.
Databáze: OpenAIRE