Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs

Autor:	Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango C.-T. Chao, Shi-Hao Chen, Chih-Mou Tseng, Tsung-Ying Tsai
Rok vydání:	2010
Zdroj:	2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
DOI:	10.1109/iccad.2010.5654118
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0a8092cc2e5bcb41aa017eb06e31a25a https://doi.org/10.1109/iccad.2010.5654118 Zobrazit plný text záznamu