What we know after twelve years developing and deploying test data analytics solutions
| Autor: | W. Robert Daasch, Amit Nahar, Kenneth M. Butler |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
0209 industrial biotechnology
Engineering business.industry media_common.quotation_subject 02 engineering and technology Data science 020202 computer hardware & architecture Test (assessment) Variety (cybernetics) 020901 industrial engineering & automation Analytics 0202 electrical engineering electronic engineering information engineering Key (cryptography) Quality (business) Computerized adaptive testing business Test data media_common |
| Zdroj: | ITC |
| DOI: | 10.1109/test.2016.7805844 |
| Popis: | Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/or removal, and operations monitoring. In this paper, key findings amassed during this time are summarized. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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