Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
| Autor: | Shuichi Katsui, Takuji Takahashi |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Materials science
Nanostructure Physics and Astronomy (miscellaneous) business.industry General Engineering Phase (waves) General Physics and Astronomy Spin polarized scanning tunneling microscopy Substrate (electronics) Signal law.invention Amplitude Optics law Optoelectronics Scanning tunneling microscope business Vicinal |
| Zdroj: | Japanese Journal of Applied Physics. 48:08JB03 |
| ISSN: | 1347-4065 0021-4922 |
| DOI: | 10.1143/jjap.48.08jb03 |
| Popis: | We propose a dual light illumination method in scanning tunneling microscopy (STM) for accurate characterization of photoabsorption properties of nanostructures on a substrate containing a depleted region and a consequent built-in field. In this method, both continuous and modulated lights are used to illuminate a sample surface. A change in STM current induced by the latter light is detected as a photoinduced current (PIC) signal, while the former light suppresses the effect of the built-in field near the sample surface. We have discussed the origins of PIC signals and examined the effectiveness of the dual light illumination method through direct observation of waveforms of PIC signals as well as lock-in detection of their amplitude and phase components on InAs wires formed on a vicinal GaAs substrate. |
| Databáze: | OpenAIRE |
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