Transient analysis to study the effect of external EMI on FSD operation in MCCB
| Autor: | Jitendar Veeramalla, Rajesh Kumar Panda |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Engineering
business.industry Electrical engineering Mechanical engineering 020206 networking & telecommunications 02 engineering and technology Magnetic flux Conductor Terminal (electronics) Magnet Electromagnetic shielding 0202 electrical engineering electronic engineering information engineering Transient (oscillation) business Electrical conductor Circuit breaker |
| Zdroj: | 2016 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES). |
| DOI: | 10.1109/pedes.2016.7914392 |
| Popis: | Magnetically latched device such as flux shift trip device along with an electronic release are used in circuit breaker so as to protect it against faulty condition. Performance of this device gets effected due to external local magnetic field generated by the conductors, which is terminated at the line and load terminal of the MCCB. In order to avoid this suitable shielding of the FSD is done by means of enclosing it with a moderate permeable magnetic material sheet. However in actual practice, the geometrical position of the conductor also decides the operation of this device. The paper discuss in detail about basic construction and operation of FSD and its shielding arrangement in MCCB. Transient electromagnetic analysis explains about the effect of external magnetic field distribution upon performance of FSD with different geometrical position of the conductor. It is observed that use of rare earth permanent magnet over AlNiCo material will provide higher magnetising strength and hence improve performance of FSD. As compared to the flat conductor position, triangular arrangement of conductor would give better performance in terms of higher de-latch current of FSD and avoid nuisance tripping of MCCB. |
| Databáze: | OpenAIRE |
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