Microstructure profiling and photoluminescence characteristics of V(1-x)2 Ni3xO5-δ compound systems
| Autor: | S. Zh. Karazhanov, K. Safna, M. Sabna, Jeyanthinath Mayandi, P. Jayaram |
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| Rok vydání: | 2020 |
| Předmět: |
Diffraction
Materials science Photoluminescence Band gap Scanning electron microscope Mechanical Engineering Analytical chemistry 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics Microstructure 01 natural sciences Spectral line 0104 chemical sciences Mechanics of Materials General Materials Science 0210 nano-technology Luminescence Spectroscopy |
| Zdroj: | Materials Letters. 266:127507 |
| ISSN: | 0167-577X |
| DOI: | 10.1016/j.matlet.2020.127507 |
| Popis: | V2-xNi3xO5-δ (V-Ni-O) based multi-cation materials have been prepared by high-temperature solid-state reaction for x between 0.03 and 0.06. The as synthesized V-Ni-O complex ceramic materials were subjected to microstructure profiling and photoluminescence studies. Structural analysis by x-ray diffraction pattern shows preferential growth direction analogous to that of V2O5. Scanning electron microscopy and energy dispersive x-ray spectroscopy shows dense lattice and the presence of Ni cations. Photoluminescence spectra of the samples exhibited both near band edge and deep level emissions. The optical band gap is found restructured in the compound due to the presence of Ni. The observed band edge emissions are broad with significant Gaussian asymmetry and are deconvoluted for individual components. The luminescent peaks between 2.28 eV and 2.31 eV have been observed for varying mole fractions. |
| Databáze: | OpenAIRE |
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