| Autor: |
Li Xu, Rongbao Shi, Yiqun Ji, Rudong Xue, Hucheng He, Weimin Shen |
| Rok vydání: |
2011 |
| Předmět: |
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| Zdroj: |
2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology. |
| ISSN: |
0277-786X |
| Popis: |
Based on the wave aberration theory, a new method of optical design of the planate symmetric Offner type imaging spectrometer is performed. Astigmatism changing with the diffraction angle of the grating, the meridional and saggital focusing characters are all studied. Determination of the initial configurations and optimally design methods of two improved types of Offner imaging spectrometer are discussed in detailed. A design example with the numerical aperture larger than 0.2, and the entrance slit 30mm is given. Its spectral resolution is better than 2nm and MTF is above 0.7@20lp/mm. The smile and keystone are less than 3% and 0.2% of the pixel respectively. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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