Static Characterization of the X-Hall Current Sensor in BCD10 Technology

Autor:	Gian Piero Gibiino, Marco Crescentini, Marco Marchesi, Marco Cogliati, Aldo Romani, Pier Andrea Traverso
Rok vydání:	2022
Zdroj:	Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing.
DOI:	10.21014/tc4-2022.58
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0959bf98854568173747de0857b8d5a0 https://doi.org/10.21014/tc4-2022.58 Zobrazit plný text záznamu