Replica Technique for Systematic Examination of a Surface under the Electron Microscope
| Autor: | Florence Nesh |
|---|---|
| Rok vydání: | 1956 |
| Předmět: |
Conventional transmission electron microscope
Materials science Microscope business.industry Replica General Physics and Astronomy law.invention Multiphoton fluorescence microscope Optics Electron tomography law Scanning transmission electron microscopy Electron microscope business Environmental scanning electron microscope |
| Zdroj: | Journal of Applied Physics. 27:1252-1253 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.1722246 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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