First Demonstration of 1-bit Erase in Vertical NAND Flash Memory

Autor:	Ho-Nam Yoo, Jong-Won Back, Nam-Hun Kim, Dongseok Kwon, Byung-Gook Park, Jong-Ho Lee
Rok vydání:	2022
Zdroj:	2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
DOI:	10.1109/vlsitechnologyandcir46769.2022.9830445
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::09026eb2841f2c2a660d67af74e87a15 https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830445 Zobrazit plný text záznamu