| Popis: |
An electro-optic characterization apparatus based on an AC modulated Senarmont compensator, which is particularly suited for studying the electro-optic response of thin polymer films, has been developed. The system is capable of measuring the Pockel's effect at a variety of wavelengths with a minimum phase-shift sensitivity of 1 mu rad. Sample to sample variations in the coefficient measurements are less than 15%. A systematic evaluation of thin, poled electro-optic polymer films on coplanar electrodes has been made to demonstrate the usefulness of the apparatus, Corrections are described for the fringing effects of the applied electric field. The reproducibility of the electro-optic data has been verified through an examination of the polymer thickness dependence. > |
