Probing angle-resolved reflection signatures of intralayer and interlayer excitons in monolayer and bilayer MoS2

Autor:	Hanwei Hu, Xuewen Zhang, Xinyu Zhang, Lishu Wu, Vanessa Li Zhang, Silin He, Guangchao Shi, Ting Yu, Jingzhi Shang
Rok vydání:	2022
Předmět:	General Materials Science Electrical and Electronic Engineering Condensed Matter Physics Atomic and Molecular Physics and Optics
Zdroj:	Nano Research. 16:7844-7850
ISSN:	1998-0000 1998-0124
DOI:	10.1007/s12274-022-5292-4
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::08f2f8ad02dfbe505fd571f57d66562b https://doi.org/10.1007/s12274-022-5292-4 Zobrazit plný text záznamu Full text from SpringerLink