Low energy electron oscillations during epitaxial growth of thin films

Autor:	David Kerkmann, Elio Vescovo, J. W. Krewer, Dimitri Pescia
Rok vydání:	1991
Předmět:	Materials science Condensed matter physics Oscillation business.industry Crystal growth Electron Condensed Matter Physics Epitaxy Electronic Optical and Magnetic Materials Optics General Materials Science Specular reflection Thin film Spectroscopy business Deposition (law)
Zdroj:	Zeitschrift f�r Physik B Condensed Matter. 85:311-314
ISSN:	1434-6036 0722-3277
DOI:	10.1007/bf01313234
Popis:	We have measured the specularly reflected intensity of low energy (12 eV) electrons as a function of the deposition time during the growth of Cu-thin films on fcc-Co(100) and Co-thin films on Cu(100). The measured curves show pronounced periodical oscillations. The origin of these oscillations is identified as arising from the interference of the electron waves reflected at the vacuum-film and film-substrate boundaries.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::08cfd6e60908d78ad44151fea7779f1b https://doi.org/10.1007/bf01313234 Zobrazit plný text záznamu Full text from SpringerLink