Analysis of Point Defect Distributions in AlGaN/GaN Heterostructures via Spectroscopic Photo Current-Voltage Measurements
| Autor: | Burcu Ozden, Ming Zhao, P. K. Kandaswamy, Hu Liang, Yoga Saripalli, Min P. Khanal, Kosala Yapabandara, Vahid Mirkhani, Minseo Park, Suhyeon Youn |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science business.industry Algan gan Heterojunction 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Electronic Optical and Magnetic Materials Current voltage 0103 physical sciences Optoelectronics Point (geometry) 0210 nano-technology business |
| Zdroj: | ECS Journal of Solid State Science and Technology. 5:P3206-P3210 |
| ISSN: | 2162-8777 2162-8769 |
| DOI: | 10.1149/2.0281604jss |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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