A Simple Thermally Activated Trapping Model for AlGaN/GaN HEMTs

Autor: Luis C. Nunes, Joao L. Gomes, Filipe M. Barradas, Jose C. Pedro
Rok vydání: 2022
Zdroj: 2022 17th European Microwave Integrated Circuits Conference (EuMIC).
DOI: 10.23919/eumic54520.2022.9923433
Databáze: OpenAIRE