Raman microprobe analysis of patterned Tl-2212 thin films
| Autor: | D.J. Walls, Charles Wilker, Kirsten Elizabeth Myers, Charles F. Carter, P. Pang |
|---|---|
| Rok vydání: | 1997 |
| Předmět: |
Superconductivity
Microprobe Materials science High-temperature superconductivity Analytical chemistry Condensed Matter Physics Laser Electronic Optical and Magnetic Materials law.invention symbols.namesake law symbols Cuprate Electrical and Electronic Engineering Thin film Spectroscopy Raman spectroscopy |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 7:2126-2129 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.621012 |
| Popis: | We have used MicroRaman spectroscopy to evaluate the effects of ion-milling on the exposed edges of patterned Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ (Tl-2212) lines. Raman microprobe has previously been used to evaluate oxygen loss at the edges of patterned YBCO lines. The results indicated that appreciable oxygen loss was caused by ion-milling under certain conditions. oxygen loss at the edges will decrease non-uniformly the effective width of the superconducting line. This can, in turn, impact the electrical characteristics of patterned devices. Using the 633 nm lined of a HeNe laser, we have measured the Raman spectrum scanning across patterned and unpatterned regions of several Tl-2212 films with a mapping stage. It is well known that the Raman peak at /spl ap/497 cm/sup -1/ corresponds to the Cu-O(2) stretching mode and is correlated with the superconducting transition temperature of the material. No appreciable variation in the center frequency of the Cu-O(2) peak was observed indicating thallium cuprate films are not degraded by our patterning process, even at the edges. Variations in the power handling of Tl-2212 co-planar lines, as determined by measurement of the Third Order Intercept, were not correlated with the Raman results. |
| Databáze: | OpenAIRE |
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