CMOS QVCO With Current-Reuse, Bottom-Series Coupling, and Forward Body Biasing Techniques

Autor:	Ho Jun Chang, Changwoo Lim, Tae-Yeoul Yun
Rok vydání:	2014
Předmět:	Physics Series (mathematics) business.industry Electrical engineering Biasing Reuse Condensed Matter Physics CMOS Coupling (computer programming) Phase noise Electronic engineering Electrical and Electronic Engineering Current (fluid) business
Zdroj:	IEEE Microwave and Wireless Components Letters. 24:608-610
ISSN:	1558-1764 1531-1309
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::08afc4b8ea32ad7f1153e4e97e60b249 https://doi.org/10.1109/lmwc.2014.2326522 Zobrazit plný text záznamu