A New Type of Detector for Electron Microscopy

Autor:	N H Xuong, A C Milazzo, S Peltier, P Leblanc, F Duttweiler, L Jin, J C Bouwer, M Ellisman, S Kleinfelder
Rok vydání:	2005
Předmět:	Materials science business.industry Detector Scanning confocal electron microscopy Dark field microscopy law.invention Optics Electron tomography law Scanning transmission electron microscopy Energy filtered transmission electron microscopy Electron microscope business Instrumentation
Zdroj:	Microscopy and Microanalysis. 11
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927605510213
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::087ab3d08334cfd02b678dcfdf9fe184 https://doi.org/10.1017/s1431927605510213 Zobrazit plný text záznamu