The Preparation of Mg, Cd and Zn Samples for Crystal Orientation Mapping with BKD in an SEM

Autor:	R.A. Schwarzer
Rok vydání:	2007
Předmět:	Diffraction Optics General Computer Science Backscatter Electron diffraction business.industry Phosphor business Kikuchi line Image resolution Sample (graphics) Electron backscatter diffraction
Zdroj:	Microscopy Today. 15:40-43
ISSN:	2150-3583 1551-9295
DOI:	10.1017/s1551929500051026
Popis:	Backscatter Kikuchi Diffraction (BKD) from crystalline solids has been known since 1928. But only during the last decade, when sufficiently sensitive cameras, fast PCs and high-performance SEMs have been available, has this technique been developed into an invaluable tool for materials' science and geology. BKD is also known as “Backscatter Electron Diffraction” (EBSD) if referred to the commercial trademarked systems OXFORD/HKL “Channel” or EDAX-TSL “OIM”. Crystal Orientation Measurement/ Mapping (COM), without user intervention, is performed in an SEM by digitally scanning the beam spot across the specimen, acquiring and transferring one Backscatter Kikuchi Pattern (BKP) after another into the computer, indexing it, and calculating the crystal orientation of the grain under the beam spot. The sample is typically tilted by 70° towards a phosphor screen for pattern collection. Spatial resolution is in the range of
Databáze:	OpenAIRE
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