The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress
| Autor: | Qiang Sun, Zhijun Xu, Hong Liang Ke, Lei Jing, Yao Wang, Jian Hao |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Arrhenius equation Materials science business.industry Electrical engineering Aging test 01 natural sciences Accelerated aging Standard deviation Electronic Optical and Magnetic Materials law.invention 010309 optics LED lamp Stress (mechanics) symbols.namesake Reliability (semiconductor) law 0103 physical sciences symbols Electrical and Electronic Engineering Composite material business Diode |
| Zdroj: | IEEE Transactions on Electron Devices. 63:1148-1153 |
| ISSN: | 1557-9646 0018-9383 |
| Popis: | In this paper, the step-down aging test for light-emitting diode (LED) lamps is designed according to the stopping rule of the IESTM-28 standard and experimental data. The step-down aging experiment is under the temperature stresses of 90 °C, 80 °C, 70 °C, and 60 °C, from which the temperatures for two-step-down aging test are selected. A Nelson model is used to calculate the equivalent time from one temperature to another, and a two-stage method is adopted to establish the reliability model of LED lamps under accelerated temperature. Then, the lifetime at the ambient temperature of 25 °C is deduced by the use of Arrhenius model. It is shown that the temperatures of 90 °C and 80 °C for two-step-down aging test are the best choice, with standard deviation of reliability and standard deviation of relative lifetime less than 11% and 20%, respectively. The accelerated aging time is |
| Databáze: | OpenAIRE |
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