The study of the optical properties of In/sub 0.52/(Al/sub x/Ga/sub 1-x/)/sub 0.48/As by variable angle spectroscopic ellipsometry

Autor:	J.-H. Gau, Jia-Lin Shieh, Jen-Inn Chyi, Jen-Wei Pan
Rok vydání:	2002
Předmět:	Materials science business.industry Analytical chemistry Infrared spectroscopy Variable angle Spectral line Gallium arsenide chemistry.chemical_compound chemistry Ellipsometry Indium phosphide Optoelectronics Spectroscopy business Refractive index
Zdroj:	Seventh International Conference on Indium Phosphide and Related Materials.
DOI:	10.1109/iciprm.1995.522125
Popis:	The optical properties of In/sub 0.52/(Al/sub x/Ga/sub 1-x/)/sub 0.48/As epilayers with various x values were systematically studied using variable angle spectroscopic ellipsometry in the wavelength range of 310-1700 nm. The refractive indexes were determined. The energies and broadening parameters of the E/sub 1/ and E/sub 1/+/spl Delta//sub 1/ transitions as a function of Al composition were also examined based on the second-derivative spectra of the dielectric function. The comparison between our results and the reported data is presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::07f0f6e5f939fc8b9764d890f01d5468 https://doi.org/10.1109/iciprm.1995.522125 Zobrazit plný text záznamu