Self-Consistent Extraction of Mobility and Series Resistance: A Hierarchy of Models for Benchmarking Organic Thin-Film Transistors
| Autor: | Benoit Lessard, Stefan Blawid, Nicholas Dallaire |
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| Rok vydání: | 2022 |
| Zdroj: | IEEE Journal on Flexible Electronics. 1:114-121 |
| ISSN: | 2768-167X |
| DOI: | 10.1109/jflex.2022.3165140 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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