Potential of CCDs for UV and x‐ray plasma diagnostics (invited)

Autor:	Tom Elliott, Stewart A. Collins, Harry H. Marsh, James K. McCarthy, James Janesick, M. M. Blouke
Rok vydání:	1985
Předmět:	Physics Optics Spectrometer business.industry Resolution (electron density) Measuring instrument Plasma diagnostics Emission spectrum Spectral resolution business Instrumentation Image resolution Spectral line
Zdroj:	Review of Scientific Instruments. 56:796-801
ISSN:	1089-7623 0034-6748
Popis:	A program is under way to develop charge‐coupled device (CCD) sensors for space‐based x‐ray astronomy imaging spectrometers. To date, laboratory line emission spectra have been acquired throughout the range of 277 to 8000 eV (carbon through copper Kα emission) and CCD sensitivity has been demonstrated throughout the range of 1.1 through 8000 eV. Image resolution is excellent, limited almost entirely by the 15‐μm pixel size. These results are presented and specialized techniques are described which permit such low energy response, high spectral resolution, and efficient charge collection. Finally, analysis is presented of one particular CCD characteristic which currently limits UV and x‐ray performance: charge diffusion.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::07a5b781ea2910d4cc185d27ea28c74f https://doi.org/10.1063/1.1138176 Zobrazit plný text záznamu