Structural Characterization and Electron Tunneling at n-Si/SiO2/SAM/Liquid Interface

Autor:	Y. Gu, B. Akhremitchev, G. C. Walker, D. H. Waldeck
Rok vydání:	1999
Předmět:	Materials Chemistry Physical and Theoretical Chemistry Surfaces Coatings and Films
Zdroj:	The Journal of Physical Chemistry B. 103:5612-5612
ISSN:	1520-5207 1520-6106
DOI:	10.1021/jp991908i
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::078ebe82b7b22a7f0ab5d0be269ef190 https://doi.org/10.1021/jp991908i Zobrazit plný text záznamu