| Autor: |
David E. Oliver, Jeanne M. Vetter, Charles E. Bakis |
| Rok vydání: |
1989 |
| Předmět: |
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| Zdroj: |
Review of Progress in Quantitative Nondestructive Evaluation ISBN: 9781461280972 |
| DOI: |
10.1007/978-1-4613-0817-1_159 |
| Popis: |
A method for full-field non-contact vibration measurement based on the Michelson Interferometer has been developed and applied to a wide range of components and structures. Unlike other optical techniques such as holography, the vibration imager does not require a specialized laboratory and stable environment, works over a much wider dynamic range,and the vibration time history is available for a more detailed analysis of the structures response. Use of this technique to detect delaminations in graphite/epoxy specimens is explored in this paper. The data was compared with X-ray and ultrasonic methods. The integrity of solder joints in electronic circuit boards has also been studied by this method at the University of Wisconsin, Madison and is also presented in this paper. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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