| Autor: |
Xiao Song Wu, Cheok Man Lou, Duan Xia Xu, Rui Miao, Yu Dong Si, Xue Ning Chu |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
Advanced Materials Research. 1081:241-245 |
| ISSN: |
1662-8985 |
| DOI: |
10.4028/www.scientific.net/amr.1081.241 |
| Popis: |
As a common kind of surface defects on multi-crystalline silicon solar cells (about 65% of total defects). Based on HALCON image processing library, an automatic silicon wafer surface spot defects detection and classification system has been developed: captured color images via CCD image sensor, located wafers and spots, extracted the spot features, computed and separated the qualified regions from the unqualified ones by SVM classifier. The experimental result showed a high accuracy of 95.7% and fast image analyzing and classifying process (less than 600ms). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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