Effects of Small-scale Surface Roughness and Absorption on Refractive Index Measurement by the Brewster-angle and Critical-angle Techniques

Autor:	张晓宝 Zhang Xiao-bao, 吴素勇 Wu Suyong, 刘文斌 Liu Wen-bin, 谭中奇 Tan Zhongqi, 罗晖 Luo Hui
Rok vydání:	2017
Předmět:	Total internal reflection Brewster's angle Materials science Scale (ratio) business.industry Refractive index profile Atomic and Molecular Physics and Optics symbols.namesake Optics Surface roughness symbols Absorption (electromagnetic radiation) business Refractive index
Zdroj:	ACTA PHOTONICA SINICA. 46:412001
ISSN:	1004-4213
DOI:	10.3788/gzxb20174604.0412001
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::073eeeac7e29b690945fec07c6b3697c https://doi.org/10.3788/gzxb20174604.0412001 Zobrazit plný text záznamu