Charge effects in dielectric films of MIS structures being under high-field injection of electrons at ionizing radiation

Autor: D. V. Andreev, Vladimir M. Maslovsky, V. V. Andreev, A. A. Stolyarov
Rok vydání: 2019
Předmět:
Zdroj: International Conference on Micro- and Nano-Electronics 2018.
DOI: 10.1117/12.2521985
Databáze: OpenAIRE