Charge effects in dielectric films of MIS structures being under high-field injection of electrons at ionizing radiation
Autor: | D. V. Andreev, Vladimir M. Maslovsky, V. V. Andreev, A. A. Stolyarov |
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Rok vydání: | 2019 |
Předmět: | |
Zdroj: | International Conference on Micro- and Nano-Electronics 2018. |
DOI: | 10.1117/12.2521985 |
Databáze: | OpenAIRE |
Externí odkaz: |