An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM

Autor:	Yuuki Uchida, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi, Yoshio Takazawa, Mitsuhiko Igarashi, Makoto Yabuuchi
Rok vydání:	2021
Předmět:	Physics Variation (linguistics) Applied Mathematics Logic gate Signal Processing Electronic engineering Static random-access memory Ring oscillator Electrical and Electronic Engineering Computer Graphics and Computer-Aided Design
Zdroj:	IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :1536-1545
ISSN:	1745-1337 0916-8508
DOI:	10.1587/transfun.2020kep0017
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::06e79a94c7315a6c5d0cb4819c11ac77 https://doi.org/10.1587/transfun.2020kep0017 Zobrazit plný text záznamu