Nanometre gaps in gold wires are formed by thermal migration
| Autor: | Monica D. Edelstein, Eric M. Vogel, Ganesh K Ramachandran, David L Blackburn, John S. Suehle, Curt A. Richter |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
Materials science
business.industry Mechanical Engineering Molecular electronics Bioengineering Nanotechnology Biasing General Chemistry Electromigration Mechanics of Materials Thermal Melting point Optoelectronics General Materials Science Nanometre Electrical and Electronic Engineering Current (fluid) business Voltage |
| Zdroj: | Nanotechnology. 16:1294-1299 |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/0957-4484/16/8/052 |
| Popis: | The formation of gold wires separated by a few nanometres is reported. Such nanometre-separated gaps are formed by ramping, at ambient conditions, a bias voltage across a thin gold wire until the wire breaks or fails. Externally heating the wire does not result in a lowering of the mean bias or current conditions required for creating the break, although electromigration-based models predict rapid decreases in the current required to cause the break. Based on measurements of changes in resistance during the voltage ramp, we determine that the temperature reached in the wires is very large and can approach the melting point of gold. To avoid deleterious effects of such large temperatures on molecules, we recommend here an alternate procedure for utilizing the break protocol in molecular electronics. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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