Confidence analysis for defect-level estimation of VLSI random testing
| Autor: | K. S. Tsai, Wen-Ben Jone |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Computer science
In-circuit test Statistics Random testing Probability distribution Computerized adaptive testing Point estimation Electrical and Electronic Engineering Test plan Computer Graphics and Computer-Aided Design Confidence interval Robust confidence intervals Computer Science Applications |
| Zdroj: | ACM Transactions on Design Automation of Electronic Systems. 3:389-407 |
| ISSN: | 1557-7309 1084-4309 |
| DOI: | 10.1145/293625.293629 |
| Popis: | The defect level in circuit testing is the percentage of circuits such as chips, that are defective and shipped for use after testing. Our previously published results showed that the defect level of circuit fabrication and testing should be a probability distribution, rather than a single value, and the concept of confidence degree was proposed [Gondalia et al. 1993; Jone et al. 1995]. In this work, defect level is represented by a confidence interval which is more conventional and easier to interpret. The point estimate of defect level analysis and conditions to avoid meaningless confidence intervals are also investigated. Methods for adaptive random test length determination driven by different confidence intervals or interval length are proposed to meet both test requirements and test costs tradeoff. Finally, a complete test plan that can direct the test flow from fabrication infancy to maturity is suggested. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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