X-ray and Auger microprobe studies of vanadium-doped layered chromium-copper disulfide crystals

Autor:	A. S. Berdinskii, M. V. Topyakova, I. Yu. Filatova, Yu. P. Dikov, Evgeniy V. Korotaev, M. I. Buleev, B. M. Kuchumov, A. A. Velichko, A. Yu. Pichugin, Vladimir Sokolov, N. N. Peregudova, P. A. Prozorov, L. N. Mazalov
Rok vydání:	2014
Předmět:	Microprobe Materials science X-ray Analytical chemistry chemistry.chemical_element Vanadium Sulfur Copper Auger law.invention Inorganic Chemistry Chromium chemistry law Materials Chemistry Physical and Theoretical Chemistry Crystallization
Zdroj:	Journal of Structural Chemistry. 55:852-857
ISSN:	1573-8779 0022-4766
DOI:	10.1134/s0022476614050084
Popis:	In the work, X-ray and Auger microprobe studies of the surface of crystals prepared from powder samples of CuCr1−xVxS2 disulfides (x = 0÷0.11) by crystallization from melt in the sulfur vapor atmosphere. Sample slabs cut from ingots include crystalline layered blocks with different orientation of copper-containing extended linear inclusions separated by disulfide matrix layers. The results of the microprobe analysis of regions with copper-containing inclusions and the regions adjacent to them are presented.
Databáze:	OpenAIRE
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