Study of Atomic Structures of Silicon Surfaces by Scanning Tunneling Microscopy

Autor:	Takafumi Yao, Katsuhiro Uesugi, Katsuya Takaoka
Rok vydání:	1992
Předmět:	Materials science Silicon chemistry law chemistry.chemical_element Nanotechnology Conductive atomic force microscopy Electrical and Electronic Engineering Scanning tunneling microscope Electrochemical scanning tunneling microscope law.invention
Zdroj:	IEEJ Transactions on Electronics, Information and Systems. 112:671-678
ISSN:	1348-8155 0385-4221
DOI:	10.1541/ieejeiss1987.112.11_671
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::068c210014dc0e42a5a57db759a9ab42 https://doi.org/10.1541/ieejeiss1987.112.11_671 Zobrazit plný text záznamu