Automatic Testing Environment for Virtual Network Embedded Systems

Autor: Takeru Kuroiwa, Yusuke Aoyama, Noriyuki Kushiro
Rok vydání: 2020
Předmět:
Zdroj: ICCE
DOI: 10.1109/icce46568.2020.9043099
Popis: Network embedded systems including Internet of Things (IoT) systems oblige developers to conduct frequent tests for various configurations, which require a significant amount of time and money. Moreover, the tests might not be performed due to the impossibility to acquire target devices produced by other factories or manufacturers. We propose a testing environment on a computer composed of target device emulators, and a repository of system configurations and test cases. Therefore, the environment performs tests for various configurations automatically and drastically improves the test efficiency.
Databáze: OpenAIRE