| Autor: |
A. Seidman, P. G. Rancoita, R. Modica, M. Demarchi, S. Leonardi, A. Favalli, A. Colder, G. Fallica, Nathan I. Croitoru, M. Levalois, P. D'Angelo, D. Codegoni, P. Marie |
| Rok vydání: |
2004 |
| Předmět: |
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| Zdroj: |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 217:65-76 |
| ISSN: |
0168-583X |
| DOI: |
10.1016/j.nimb.2003.08.044 |
| Popis: |
In this paper experimental results on radiation effects on a BICMOS high speed commercial technology, manufactured by STMicroelectronics, are reported. Bipolar transistors were irradiated by neutrons, ions, or by both of them. Fast neutrons, as well as other types of particles, produce defects, mainly by displacing silicon atoms from their lattice positions to interstitial locations, i.e. generating vacancy-interstitial pairs, the so-called Frenkel pairs (FP). Defects introduce trapping energy states which degrade the common emitter current gain β. The gain degradation has been investigated for collector current Ic between 1 μA and 1 mA. It was found a linear dependence of Δ(1/β)=1/βi−1/β (where βi and β are the gain after and before the irradiation) as a function of the concentration of FP. The bipolar transistors made on this technology have shown to be particularly radiation resistant. Both base and collector currents have been also systematically investigated. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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Full Text from ScienceDirect