Theoretical estimations of FEA's reliability

Autor:	A.F. Golubentsev, V.M. Anikin
Rok vydání:	2002
Předmět:	Physics Reliability theory Markov chain Astrophysics::High Energy Astrophysical Phenomena Probabilistic logic Markov process Electron Finite element method Field electron emission symbols.namesake Reliability (semiconductor) symbols Statistical physics Astrophysics::Galaxy Astrophysics
Zdroj:	Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382).
DOI:	10.1109/ivmc.1998.728618
Popis:	Some peculiarities of the field emission from micro- and nano-structural FEAs (e.g., a random FEA structure, a random multistable current from a single emissive center) are investigated using various Markov probabilistic models for the theoretical description of fluctuation phenomena in the field emission and reliability properties of the electron sources.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0665621315c6445c005811c33674ba18 https://doi.org/10.1109/ivmc.1998.728618 Zobrazit plný text záznamu