Integrated Infrared Failure Analysis of Printed Circuit Boards

Autor: J. Miles, J. Kliman, C. R. Zelak, J. E. Sunderland
Rok vydání: 1995
Předmět:
Zdroj: Journal of Electronic Packaging. 117:288-293
ISSN: 1528-9044
1043-7398
DOI: 10.1115/1.2792107
Popis: A method is presented to test automatically for latent faults, those which elude detection during conventional electronic testing, on printed circuit boards. Testing is intended for implementation in a volume manufacturing environment and involves the application of infrared imaging tools. Successful incorporation of infrared testing into existing test processes requires that: a procedure for handling variable radiation heat transfer properties across a printed circuit board be developed; a thermally-controlled test enclosure be provided; PASS/FAIL criteria be established. These tasks are addressed, testing procedures are described, and favorable results are presented. The feasibility of an infrared test process is demonstrated.
Databáze: OpenAIRE