Integrated Infrared Failure Analysis of Printed Circuit Boards
Autor: | J. Miles, J. Kliman, C. R. Zelak, J. E. Sunderland |
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Rok vydání: | 1995 |
Předmět: | |
Zdroj: | Journal of Electronic Packaging. 117:288-293 |
ISSN: | 1528-9044 1043-7398 |
DOI: | 10.1115/1.2792107 |
Popis: | A method is presented to test automatically for latent faults, those which elude detection during conventional electronic testing, on printed circuit boards. Testing is intended for implementation in a volume manufacturing environment and involves the application of infrared imaging tools. Successful incorporation of infrared testing into existing test processes requires that: a procedure for handling variable radiation heat transfer properties across a printed circuit board be developed; a thermally-controlled test enclosure be provided; PASS/FAIL criteria be established. These tasks are addressed, testing procedures are described, and favorable results are presented. The feasibility of an infrared test process is demonstrated. |
Databáze: | OpenAIRE |
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