Optical properties of PbS thin films
| Autor: | M. G. Guseinaliyev, N. A. Kasumov, O. R. Akhmedov, N. M. Abdullaev, N. A. Abdullaev, S. S. Babaev |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Absorption spectroscopy business.industry Band gap Analytical chemistry 02 engineering and technology Dielectric Photon energy 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials symbols.namesake Optics Critical point (thermodynamics) Ellipsometry 0103 physical sciences symbols Thin film 0210 nano-technology Raman spectroscopy business |
| Zdroj: | Semiconductors. 50:50-53 |
| ISSN: | 1090-6479 1063-7826 |
| Popis: | The complex dielectric function of PbS thin films is studied by spectroscopic ellipsometry in the spectral range from 0.74 to 6.45 eV at a temperature of 293 K. The critical energies are determined to be E1 = 3.53 eV and E2 = 4.57 eV. For both energy regions, the best fit is attained at the critical point 2D (m = 0). In addition, the Raman spectra and the optical-absorption spectra of PbS thin films are studied. From the dependence of the quantity (αhν)2 on the photon energy hν, the band gap is established at Eg = 0.37 eV. |
| Databáze: | OpenAIRE |
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