72.2: Strength Measurements of Thin AMLCD Panels
Autor: | Jamie T. Westbrook, Toshihiko Ono, Jum Sik Kim, Suresh T. Gulati, John F. Bayne, Tim A. Roe, Po-Hua Su |
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Rok vydání: | 2010 |
Předmět: | |
Zdroj: | SID Symposium Digest of Technical Papers. 41:1073 |
ISSN: | 0097-966X |
DOI: | 10.1889/1.3499838 |
Popis: | The biaxial strength using ring-on-ring (ROR) test and uniaxial strength using 4-point bend test (4PB) were measured for 13.3″ panels with substrate thicknesses ranging from 0.25 mm to 0.5 mm. The effect of thinning process was quantified by these data along with identifying break sources using fractography. Strain gages were used to convert failure load to strength. |
Databáze: | OpenAIRE |
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