72.2: Strength Measurements of Thin AMLCD Panels

Autor: Jamie T. Westbrook, Toshihiko Ono, Jum Sik Kim, Suresh T. Gulati, John F. Bayne, Tim A. Roe, Po-Hua Su
Rok vydání: 2010
Předmět:
Zdroj: SID Symposium Digest of Technical Papers. 41:1073
ISSN: 0097-966X
DOI: 10.1889/1.3499838
Popis: The biaxial strength using ring-on-ring (ROR) test and uniaxial strength using 4-point bend test (4PB) were measured for 13.3″ panels with substrate thicknesses ranging from 0.25 mm to 0.5 mm. The effect of thinning process was quantified by these data along with identifying break sources using fractography. Strain gages were used to convert failure load to strength.
Databáze: OpenAIRE