Physical Behaviour of Nanocrystalline ZnS Layers Grown by Close-Spaced Evaporation

Autor:	P. Prathap, Y. P. V. Subbaiah, K.T. Ramakrishna Reddy
Rok vydání:	2007
Předmět:	Inorganic Chemistry Crystallography Photoluminescence Chemistry Analytical chemistry Deposition (phase transition) Substrate (electronics) Physical and Theoretical Chemistry Evaporation (deposition) Grain size Stoichiometry Nanocrystalline material Diffractometer
Zdroj:	Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry. 37:493-496
ISSN:	1553-3174
DOI:	10.1080/15533170701471802
Popis:	Nano‐crystalline ZnS films were deposited onto glass substrates by close‐spaced evaporation with different deposition rates in the range, 10–60 A/sec at a substrate temperature of 300°C. The as‐grown layers were characterized with X‐ray diffractometer (XRD), atomic force microscope (AFM), energy dispersive analysis of X‐rays (EDAX) and fluorescence spectrophotometer. The studies showed that the optimum rate of deposition for the growth of near stoichiometric ZnS layers was 20 A/sec. The films exhibited cubic structure in the entire range of deposition rates. The AFM data revealed that the films had nanosized grains with a grain size of ∼40 nm. The effect of rate of deposition onto photoluminescence behaviour was also studied.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::05bc0c1dbad174ae08db14ebb6f0c542 https://doi.org/10.1080/15533170701471802 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
Nepřihlášeným uživatelům se plný text nezobrazuje	K zobrazení výsledku je třeba se přihlásit.