Degradation in super-junction MOSFET under successive exposure of heavy ion strike and gamma ray irradiation

Autor:	Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Xingyu Fang, Liang Wang, Guo Jia, Zhonghan Deng
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 132:114529
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2022.114529
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::055d16a0783e52baa49fe875158aad5b https://doi.org/10.1016/j.microrel.2022.114529 Zobrazit plný text záznamu Full Text from ScienceDirect