Refractive-index variation with rare-earth incorporation in amorphous Al2O3 thin films
Autor: | Nur Ismail, Jonathan D. B. Bradley, Mats Götelid, Markus Pollnau, Pavel Loiko |
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Rok vydání: | 2017 |
Předmět: |
Materials science
business.industry Amplifier Rare earth 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Laser 01 natural sciences Electronic Optical and Magnetic Materials law.invention Amorphous solid 010309 optics Optics law 0103 physical sciences Rare earth ions Materials Chemistry Ceramics and Composites Optoelectronics Thin film 0210 nano-technology business Refractive index Aluminum oxide |
Zdroj: | Journal of Non-Crystalline Solids. 476:95-99 |
ISSN: | 0022-3093 |
DOI: | 10.1016/j.jnoncrysol.2017.09.033 |
Popis: | Rare-earth-doped amorphous aluminum oxide (Al2O3;RE3+) thin films are attractive materials for near-IR amplifiers and lasers that can be integrated with silicon-on-insulator waveguides or deposited ... |
Databáze: | OpenAIRE |
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